Birkholz, M. (2006). Thin Film Analysis by X-Ray Scattering. Wiley-Vch.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma Chicago
Birkholz, Mario. Thin Film Analysis by X-Ray Scattering. Weinheim: Wiley-Vch, 2006.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma MLA
Birkholz, Mario. Thin Film Analysis by X-Ray Scattering. Wiley-Vch, 2006.
Successfully copied to clipboard
Copying to clipboard failed
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.