Wang, L., Wu, C., & Wen, X. (2006). VLSI Test Principles and Architectures. Elsevier Inc..
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Citação norma Chicago
Wang, Laung-Terng, Cheng-Wen Wu, and Xiaoqing Wen. VLSI Test Principles and Architectures. San Francisco: Elsevier Inc., 2006.
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Citação norma MLA
Wang, Laung-Terng, et al. VLSI Test Principles and Architectures. Elsevier Inc., 2006.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.