Ubar, R., Raik, J., & Vierhaus, T. H. (2011). Design and test technology for dependable systems-on-chip (1. vyd.). IGI Global.
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Chicago Style (17th ed.) Citation
Ubar, Raimund, Jaann Raik, and Theodor Heinrich Vierhaus. Design and Test Technology for Dependable Systems-on-chip. 1. vyd. Hershey: IGI Global, 2011.
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MLA (9th ed.) Citation
Ubar, Raimund, et al. Design and Test Technology for Dependable Systems-on-chip. 1. vyd. IGI Global, 2011.
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Warning: These citations may not always be 100% accurate.