Goodhew, P. J., Humphreys, J., & Beanland, R. (2001). Electron microscopy and analysis (3rd ed.). Taylor and Francis.
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Citação norma Chicago
Goodhew, Peter J., John Humphreys, and Richard Beanland. Electron Microscopy and Analysis. 3rd ed. London: Taylor and Francis, 2001.
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Citação norma MLA
Goodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor and Francis, 2001.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.