Beyerer, J., Hagmanns, R., & Stadler, D. (2024). Pattern Recognition: Introduction, Features, Classifiers and Principles (2. vydanie.). Walter de Gruyter.
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Chicago Style (17th ed.) Citation
Beyerer, Jürgen, Raphael Hagmanns, and Daniel Stadler. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2. vydanie. Berlin: Walter de Gruyter, 2024.
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MLA (9th ed.) Citation
Beyerer, Jürgen, et al. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2. vydanie. Walter de Gruyter, 2024.
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Warning: These citations may not always be 100% accurate.