Gusev, E. (2006). Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Verlag.
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Citação norma Chicago
Gusev, Evgeni. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Dordrecht: Springer Verlag, 2006.
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Citação norma MLA
Gusev, Evgeni. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Verlag, 2006.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.