Ma, T. (1989). Ionizing radiation effects in MOS devices and circuits. John Wiley & Sons.
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Citação norma Chicago
Ma, T.P. Ionizing Radiation Effects in MOS Devices and Circuits. New York: John Wiley & Sons, 1989.
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Citação norma MLA
Ma, T.P. Ionizing Radiation Effects in MOS Devices and Circuits. John Wiley & Sons, 1989.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.