Leach, R. K. (2010). Fundamental principles of engineering nanometrology. Elsevier.
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Citação norma Chicago
Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Amsterdam: Elsevier, 2010.
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Citação norma MLA
Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Elsevier, 2010.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.