Runyan, W., & Shaffner, T. (1997). Semiconductor Measurements and Instrumentation. McGraw-Hill.
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Citação norma Chicago
Runyan, W.R, and T.J Shaffner. Semiconductor Measurements and Instrumentation. New York: McGraw-Hill, 1997.
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Citação norma MLA
Runyan, W.R, and T.J Shaffner. Semiconductor Measurements and Instrumentation. McGraw-Hill, 1997.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.