Cita APA (7a ed.)
(1984). Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th international conference. Osaka, 13.- 19. Nov. 1983. Springer Verlag.
Cita Chicago Style (17a ed.)
Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th International Conference. Osaka, 13.- 19. Nov. 1983. Berlin: Springer Verlag, 1984.
Cita MLA (9a ed.)
Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th International Conference. Osaka, 13.- 19. Nov. 1983. Springer Verlag, 1984.
Precaución: Estas citas no son 100% exactas.