Benninghoven, A. (1979). Secondary ion Mass Spestrometry. SIMS 2: Proceedings of the 2 international conference. Stanford, USA. 27.- 31. Aug. 1979. Springer Verlag.
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Chicago Style (17th ed.) Citation
Benninghoven, A. Secondary Ion Mass Spestrometry. SIMS 2: Proceedings of the 2 International Conference. Stanford, USA. 27.- 31. Aug. 1979. Berlin: Springer Verlag, 1979.
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MLA (9th ed.) Citation
Benninghoven, A. Secondary Ion Mass Spestrometry. SIMS 2: Proceedings of the 2 International Conference. Stanford, USA. 27.- 31. Aug. 1979. Springer Verlag, 1979.
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Warning: These citations may not always be 100% accurate.