Cita APA (7a ed.)
Benninghoven, A. (1979). Secondary ion Mass Spestrometry. SIMS 2: Proceedings of the 2 international conference. Stanford, USA. 27.- 31. Aug. 1979. Springer Verlag.
Cita Chicago Style (17a ed.)
Benninghoven, A. Secondary Ion Mass Spestrometry. SIMS 2: Proceedings of the 2 International Conference. Stanford, USA. 27.- 31. Aug. 1979. Berlin: Springer Verlag, 1979.
Cita MLA (9a ed.)
Benninghoven, A. Secondary Ion Mass Spestrometry. SIMS 2: Proceedings of the 2 International Conference. Stanford, USA. 27.- 31. Aug. 1979. Springer Verlag, 1979.
Precaución: Estas citas no son 100% exactas.