Sachdev, M. (1998). Defect Oriented testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers.
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Citação norma Chicago
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Dordrecht: Kluwer Academic Publishers, 1998.
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Citação norma MLA
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers, 1998.
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Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.