Search Results - Reid, Dave

Statistical Simulation of Random Dopant Induced Threshold Voltage Fluctuations for 35 nm Channel Length MOSFET by Kováč, Urban

Other Authors: “…Reid, Dave…”

<The> compact modelling strategy on SNM and read current variability in modern SRAM by Asenov, P.

Other Authors: “…Reid, Dave…”

Advanced simulation of statistical variability and reliability in nano CMOS transistors by Asenov, Asen

Other Authors: “…Reid, Dave…”