Hierarchical Simulation of Statistical Variability From 3-D MC with "Ab Initio” Ionized Impurity Scattering to Statistical Compact Models

Documenti analoghi

• A unified density gradient approach to ‘ab-initio’ ionised impurity scattering in 3D MC simulations of nano-CMOS variability
  di: Craig, Alexander
• Compact model extraction from quantum corrected statistical Monte Carlo simulation of random dopant induced drain current variability
  di: Kováč, Urban
• Advanced simulation of statistical variability and reliability in nano CMOS transistors
  di: Asenov, Asen
• Use of Density Gradient Quantum Corrections in the Simulation of Statistical Variability in MOSFETs
  di: Brown, Adrew R.
• Linguistically summarizing hierarchical data: the case of statistical territorial data
  di: Hudec, Miroslav, 1969-