Modeling and simulation of transistor and circuit variability and reliability

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Bibliographic Details
Main Author: Asenov, Asen
Other Authors: Cheng, Binjie, Dideban, D., Kováč, Urban, Moezi, N., Millar, Campbell, Roy, Gareth, Brown, Adrew R., Roy, Scott
Format: Book Chapter
Language:English
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041 0 |a eng 
044 |a US 
245 1 0 |a Modeling and simulation of transistor and circuit variability and reliability  |c Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy 
100 1 |a Asenov, Asen 
700 1 |a Cheng, Binjie 
700 1 |a Dideban, D. 
700 1 |a Kováč, Urban 
700 1 |a Moezi, N. 
700 1 |a Millar, Campbell 
700 1 |a Roy, Gareth 
700 1 |a Brown, Adrew R. 
700 1 |a Roy, Scott