Modeling and simulation of transistor and circuit variability and reliability
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| Format: | Buchkapitel |
| Sprache: | Englisch |
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| LEADER | 00000nla$a2200000$$$4500 | ||
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| 001 | 0127863 | ||
| 005 | 20240502083321.9 | ||
| 041 | 0 | |a eng | |
| 044 | |a US | ||
| 245 | 1 | 0 | |a Modeling and simulation of transistor and circuit variability and reliability |c Asen Asenov, Binjie Cheng, D. Dideban, Urban Kováč, N. Moezi, Campbell Millar, Gareth Roy, Adrew R. Brown, Scott Roy |
| 100 | 1 | |a Asenov, Asen | |
| 700 | 1 | |a Cheng, Binjie | |
| 700 | 1 | |a Dideban, D. | |
| 700 | 1 | |a Kováč, Urban | |
| 700 | 1 | |a Moezi, N. | |
| 700 | 1 | |a Millar, Campbell | |
| 700 | 1 | |a Roy, Gareth | |
| 700 | 1 | |a Brown, Adrew R. | |
| 700 | 1 | |a Roy, Scott | |