Charackterization, Testing, Measurement, and Metrology /
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Boca Raton
CRC Press
2021
|
| Schriftenreihe: | Manufacturing Design and Technology Series
|
| Schlagworte: | |
| Tags: |
Keine Tags, Fügen Sie das erste Tag hinzu!
|
MARC
| LEADER | 00000nam a22000003a 4500 | ||
|---|---|---|---|
| 001 | 0084790 | ||
| 003 | SK-STU | ||
| 005 | 20201130135900.4 | ||
| 007 | ta | ||
| 008 | 201130s ----xo-----e------000-0-----d | ||
| 020 | |a 978-0-367-27515-0 | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu | ||
| 100 | 1 | |a Prakash, Chander |4 aut | |
| 245 | 1 | 0 | |a Charackterization, Testing, Measurement, and Metrology / |c aut. Chander Prakash, Sunpreet Singh, J. Paulo Davim |
| 260 | |a Boca Raton |b CRC Press |c 2021 | ||
| 300 | |a 192 s. | ||
| 490 | 0 | |a Manufacturing Design and Technology Series | |
| 650 | 0 | 7 | |a metrológia |
| 700 | 1 | |a Singh, Sunpreet |4 aut | |
| 700 | 1 | |a Davim, J. Paulo |4 aut | |
| 996 | |b 284M088500 |c M* 14403-1 |l MMKN |s A |a 24 |w 0084790_0001 | ||