characterization, testing measurement, and metrology /

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Bibliographic Details
Main Authors: Prakash, Chander (Author), Singh, Sunpreet (Author), Davim, J. Paulo (Author)
Format: Book
Language:English
Published: Boca Raton (USA) CRC Press 2021
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MARC

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100 1 |a Prakash, Chander  |4 aut 
245 1 0 |a characterization, testing measurement, and metrology /  |c aut. Chander Prakash, Sunpreet Singh, J. Paulo Davim 
260 |a Boca Raton (USA)  |b CRC Press  |c 2021 
300 |a 192 s. 
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650 0 7 |a meranie 
650 0 7 |a metrológia 
700 1 |a Singh, Sunpreet  |4 aut 
700 1 |a Davim, J. Paulo  |4 aut 
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