Thin film and depth profile analysis /
Guardado en:
| Otros Autores: | |
|---|---|
| Formato: | Libro |
| Lenguaje: | inglés |
| Publicado: |
Berlin :
Springer Verlag,
1984
|
| Etiquetas: |
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MARC
| LEADER | 00000nam a22000003a 4500 | ||
|---|---|---|---|
| 001 | stu123614 | ||
| 005 | 20150617225859.8 | ||
| 008 | 060719s1984----gw------------------eng-d | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a gw | ||
| 080 | |a 538.97 |7 stu_us_auth*stu8133 | ||
| 080 | |a 539.24/.27 | ||
| 100 | 1 | |a Oechsner, H. |4 com | |
| 245 | 1 | |a Thin film and depth profile analysis / |c Ed.: Oechsner, H. | |
| 260 | |a Berlin : |b Springer Verlag, |c 1984 | ||
| 300 | |a 11, 205 s | ||
| 996 | |b E56659 |c E*56659 |l EE11 |s P |a 0 |w stu123614_0001 | ||