Advances in X-Ray Analysis. Volume 36

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Bibliographische Detailangaben
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	New York : Plenum Press, 1993
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Introduction to X-Ray Spectrometric Analysis /
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X-ray crystallography
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Thin Film Analysis by X-Ray Scattering /
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Structure Determination by X-ray Crystallography : Analysis by X-rays and Neutrons
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A Practical Guide for the Preparation f Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis /
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Principles of x-ray crystallography /
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Elements of X-Ray Diffraction /
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Accelerator X-Ray Sources
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Advanced Methods in X-Ray and Neutron Structure Analysis of Materials : International Conference : Konf. Praha. Czechoslovakia. 20-24th August 1990
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X-Ray CT : Hardware and Software Techniques /
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Surface Analysis by Auger and X-ray Photoelectron Spectroscopy /
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Radionuclide X-ray fluorescence analysis with environmental applications /
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Modern X-ray analysis on single crystals a practical guide
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X−ray structural analysis of compounds with expected practical application.
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Practical surface analysis by Auger and X-ray photoelectron spectroscopy /
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Quantitative X-Ray Analysis of Bentonite in Moulding Sands. Spain /
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Enhancement of X-Ray Image Quality
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X-Ray Metrology in Semiconductor Manufactoring
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Early days of X-ray crystallography /
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Principles of Protein X-ray Crystallography /
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X-ray analysers in process control /
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Meranie pomocou X-Ray techniky
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X-ray diffraction crystallography : introduction, examples and solved problems
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X-Rays From Laser Plasmas : Generation and Applications