Electron microscopy and analysis /
Guardado en:
| Autores principales: | , , |
|---|---|
| Formato: | Libro |
| Lenguaje: | inglés |
| Publicado: |
London
Taylor and Francis
2001
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| Edición: | 3rd ed. |
| Materias: | |
| Etiquetas: |
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MARC
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| 003 | SK-STU | ||
| 005 | 20211026131545.2 | ||
| 007 | ta | ||
| 008 | 211026s ----xo-----e------000-0-----d | ||
| 020 | |a 978-0-7484-0968-8 | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a xxk | ||
| 100 | 1 | |a Goodhew, Peter J. |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis / |c aut. Peter J Goodhew, John Humphreys, Richard Beanland |
| 250 | |a 3rd ed. | ||
| 260 | |a London |b Taylor and Francis |c 2001 | ||
| 300 | |a 251 s. | ||
| 650 | 0 | 7 | |a elektrónová mikroskopia |
| 700 | 1 | |a Humphreys, John |4 aut | |
| 700 | 1 | |a Beanland, Richard |4 aut | |
| 996 | |b 284M088858 |c M* 14511-1 |l MMST |s A |a 24 |w 0091115_0001 | ||