Study of Interconnect Layers Oriented to Ohmic and Barrier Effects : Dát. obhaj. 16.12.2010, čís. ved. odb. 5.2.13
Na minha lista:
| Autor principal: | |
|---|---|
| Outros Autores: | |
| Formato: | Manuscrito Livro |
| Publicado em: |
Bratislava :
STU v Bratislave FEI,
2010
|
| Assuntos: | |
| Tags: |
Sem tags, seja o primeiro a adicionar uma tag!
|
MARC
| LEADER | 00000ntm a22000003a 4500 | ||
|---|---|---|---|
| 001 | stu219998 | ||
| 005 | 20160719165134.5 | ||
| 008 | 110113s2010----xo----------------------d | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | ||
| 044 | |a xo | ||
| 100 | 1 | |a Sumega, Miroslav |4 aut | |
| 242 | 0 | 0 | |a Štúdium ohmických a bariérových javov prechodových vrstiev |
| 245 | 1 | |a Study of Interconnect Layers Oriented to Ohmic and Barrier Effects : |b Dát. obhaj. 16.12.2010, čís. ved. odb. 5.2.13 | |
| 260 | |a Bratislava : |b STU v Bratislave FEI, |c 2010 | ||
| 300 | |a 100 s | ||
| 650 | 7 | |a elektronika |2 stusub | |
| 650 | 7 | |a prechodné javy |2 stusub | |
| 700 | 1 | |a Áč, Vladimír |4 ths | |
| 996 | |b 284ED01317 |c E*ZP-181 |l EE01 |s A |a 24 |w stu219998_0001 | ||