Defect Oriented testing for CMOS Analog and Digital Circuits
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht :
Kluwer Academic Publishers,
1998
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
| Physical Description: | 308 s |
|---|---|
| ISBN: | 0-7923-8083-5 |