Optické vlastnosti vrstiev nanočastíc

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Bibliographic Details
Main Author:	Kurtulík, Matej (Author)
Other Authors:	Chlpík, Juraj (Thesis advisor)
Format:	Manuscript Book
Language:	Slovak
Published:	2015
Subjects:	lokalizovaná plazmónová rezonancia tenké vrstvy elipsometrické meranie thin layers localized plasmons resonance ellipsometric measurement
Online Access:	http://is.stuba.sk/zp/portal_zp.pl?podrobnosti=105090
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