Scanning electron microscopy and x-ray microanalysis /
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| Main Authors: | , , , , , |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
2018.
|
| Edition: | Fourth edition. |
| Subjects: | |
| Online Access: | View in OPAC |
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| Item Description: | Previous edition: New York: Plenum Press, 2003. |
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| Physical Description: | xxiii, 550 pages : illustrations (black and white, and colour) ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781493966745 |