Secondary ion Mass Spestrometry. SIMS 2 : Proceedings of the 2 international conference. Stanford, USA. 27.- 31. Aug. 1979 /
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| Format: | Book |
| Language: | English |
| Published: |
Berlin :
Springer Verlag,
1979
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| 100 | 1 | |a Benninghoven, A. |4 com | |
| 245 | 1 | |a Secondary ion Mass Spestrometry. SIMS 2 : |b Proceedings of the 2 international conference. Stanford, USA. 27.- 31. Aug. 1979 / |c Ed.: Benninghoven, A. | |
| 260 | |a Berlin : |b Springer Verlag, |c 1979 | ||
| 300 | |a 13, 295 s | ||
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