Advanced simulation of statistical variability and reliability in nano CMOS transistors
Enregistré dans:
| Auteur principal: | |
|---|---|
| Autres auteurs: | , , , , , , , , , , , , |
| Format: | Chapitre de livre |
| Langue: | anglais |
| Tags: |
Pas de tags, Soyez le premier à ajouter un tag!
|
Documents similaires: Advanced simulation of statistical variability and reliability in nano CMOS transistors
- Modeling and simulation of transistor and circuit variability and reliability
- Simulation of Statistical Variability in Nano-CMOS Transistors Using Drift-diffusion, Monte Carlo and Non-equilibrium Green's Function Techniques
- A unified density gradient approach to ‘ab-initio’ ionised impurity scattering in 3D MC simulations of nano-CMOS variability
- Electronic Device Architectures Nano-CMOS Era : From Ultimate CMOS Scaling to Beyond CMOS Devices
- Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
- Microwave transistors