Advanced simulation of statistical variability and reliability in nano CMOS transistors
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| Format: | Buchkapitel |
| Sprache: | Englisch |
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| LEADER | 00000nla$a2200000$$$4500 | ||
|---|---|---|---|
| 001 | 0127878 | ||
| 005 | 20240502083321.9 | ||
| 041 | 0 | |a eng | |
| 044 | |a US | ||
| 245 | 1 | 0 | |a Advanced simulation of statistical variability and reliability in nano CMOS transistors |c Asen Asenov, Scott Roy, Adrew R. Brown, Gareth Roy, Craig Alexander, Craig Riddet, Campbell Millar, Binjie Cheng, Antonio Martinez, Natalia Seoane, Dave Reid, M.F. Bukhori, X. Wang, Urban Kováč |
| 100 | 1 | |a Asenov, Asen | |
| 700 | 1 | |a Roy, Scott | |
| 700 | 1 | |a Brown, Adrew R. | |
| 700 | 1 | |a Roy, Gareth | |
| 700 | 1 | |a Alexander, Craig | |
| 700 | 1 | |a Riddet, Craig | |
| 700 | 1 | |a Millar, Campbell | |
| 700 | 1 | |a Cheng, Binjie | |
| 700 | 1 | |a Martinez, Antonio | |
| 700 | 1 | |a Seoane, Natalia | |
| 700 | 1 | |a Reid, Dave | |
| 700 | 1 | |a Bukhori, M.F. | |
| 700 | 1 | |a Wang, X. | |
| 700 | 1 | |a Kováč, Urban | |