Advanced simulation of statistical variability and reliability in nano CMOS transistors

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Main Author: Asenov, Asen
Other Authors: Roy, Scott, Brown, Adrew R., Roy, Gareth, Alexander, Craig, Riddet, Craig, Millar, Campbell, Cheng, Binjie, Martinez, Antonio, Seoane, Natalia, Reid, Dave, Bukhori, M.F, Wang, X., Kováč, Urban
Format: Book Chapter
Language:English
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LEADER 00000nla$a2200000$$$4500
001 0127878
005 20240502083321.9
041 0 |a eng 
044 |a US 
245 1 0 |a Advanced simulation of statistical variability and reliability in nano CMOS transistors  |c Asen Asenov, Scott Roy, Adrew R. Brown, Gareth Roy, Craig Alexander, Craig Riddet, Campbell Millar, Binjie Cheng, Antonio Martinez, Natalia Seoane, Dave Reid, M.F. Bukhori, X. Wang, Urban Kováč 
100 1 |a Asenov, Asen 
700 1 |a Roy, Scott 
700 1 |a Brown, Adrew R. 
700 1 |a Roy, Gareth 
700 1 |a Alexander, Craig 
700 1 |a Riddet, Craig 
700 1 |a Millar, Campbell 
700 1 |a Cheng, Binjie 
700 1 |a Martinez, Antonio 
700 1 |a Seoane, Natalia 
700 1 |a Reid, Dave 
700 1 |a Bukhori, M.F. 
700 1 |a Wang, X. 
700 1 |a Kováč, Urban 

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