Advanced simulation of statistical variability and reliability in nano CMOS transistors

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Bibliographic Details
Main Author: Asenov, Asen
Other Authors: Roy, Scott, Brown, Adrew R., Roy, Gareth, Alexander, Craig, Riddet, Craig, Millar, Campbell, Cheng, Binjie, Martinez, Antonio, Seoane, Natalia, Reid, Dave, Bukhori, M.F, Wang, X., Kováč, Urban
Format: Book Chapter
Language:English
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