Design and test technology for dependable systems-on-chip /

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Bibliographic Details
Other Authors: Ubar, Raimund (Editor), Raik, Jaann (Editor), Vierhaus, Theodor Heinrich (Editor)
Format: Book
Language:English
Published: Hershey IGI Global 2011
Edition:1. vyd.
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Description
Physical Description:550 s.
ISBN:978-1-60960-212-3