Defect and Microstructure Analysis by Diffraction
Enregistré dans:
| Auteurs principaux: | , , |
|---|---|
| Format: | Livre |
| Langue: | anglais |
| Publié: |
Oxford :
Oxford University Press,
1999
|
| Collection: | IUCr Monographs on Crystallography
10 |
| Sujets: | |
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| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a uk | ||
| 080 | |a 52-656 | ||
| 100 | 1 | |a Snyder, Robert L. |4 aut | |
| 245 | 1 | |a Defect and Microstructure Analysis by Diffraction | |
| 260 | |a Oxford : |b Oxford University Press, |c 1999 | ||
| 300 | |a 785 s | ||
| 650 | 7 | |a difrakcia |2 stusub | |
| 700 | 1 | |a Fiala, Jaroslav |4 aut | |
| 700 | 1 | |a Bunge, Hans Joachim |4 aut | |
| 830 | 0 | |a IUCr Monographs on Crystallography |v 10 | |
| 996 | |b 284M076628 |c M*12153-1 |l MMKN |s A |a 24 |w stu143474_0001 | ||