Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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| Autori principali: | , |
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| Natura: | Libro |
| Lingua: | inglese |
| Pubblicazione: |
Dordrecht :
Springer Verlag,
2007
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| Edizione: | 2.ed. |
| Soggetti: | |
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