Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht :
Springer Verlag,
2007
|
| Edition: | 2.ed. |
| Subjects: | |
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| 008 | 080903s2007----ne------------------eng-d | ||
| 020 | |a 978-0-387-46546-3 | ||
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| 100 | 1 | |a Sachdev, Manoj |4 aut | |
| 245 | 1 | |a Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | |
| 250 | |a 2.ed. | ||
| 260 | |a Dordrecht : |b Springer Verlag, |c 2007 | ||
| 300 | |a 328 s | ||
| 650 | 7 | |a CMOS |2 stusub | |
| 650 | 7 | |a integrované obvody |2 stusub | |
| 650 | 7 | |a polovodiče |2 stusub | |
| 700 | 1 | |a Gyvez, José Pineda |4 aut | |
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