Skúmanie odolnosti výkonových tranzistorov v podmienkach SC a UIS testu

Saved in:
Bibliographic Details
Main Author: Špánik, Patrik Ján (Author)
Other Authors: Marek, Juraj (Thesis advisor)
Format: Manuscript Book
Language:Slovak
Published: Bratislava : STU v Bratislave FEI, 2023
Subjects:
Online Access:https://opac.crzp.sk/?fn=detailBiblioFormChildU76H7&sid=EC7951772ACC837B5F7CC9A56A1E&seo=CRZP-detail-kniha
Tags: Add Tag
No Tags, Be the first to tag this record!